NE 591 611 Advanced Characterization of Nuclear Materials

3 Credit Hours

This course introduces characterization needs of nuclear materials, atomic structure and spectra, X-ray scattering and diffraction, electron scattering and imaging, special topics on nuclear materials sampling, post-irradiation examination, other advanced characterization techniques and their application in nuclear materials studies. While some of these concepts are traditionally covered in materials science and engineering curricula, the primary focus of this course is to equip students with a deep understanding of the principles and practical application of nuclear materials characterization. Upon completion of this course, students will possess the knowledge and skills needed to investigate scientific and engineering questions in nuclear materials science through the utilization of various characterization techniques and methods.

Prerequisite

MSE201 (Structure and Properties of Engineering Materials), NE/MSE 409/509 (Nuclear Materials) or equivalent.

Course Objectives

• Uses basic material knowledge to understand the microstructure – property relationships in nuclear materials.
• Explores the usage of modern examination techniques to characterize and qualify materials for structural and energy applications.

Course Requirements

Grading criteria:
Homework Problems: 20%
Midterm Exam: 20%
Final Exam: 20%
Project Presentation: 20%
Project Report: 20%

Course Outline

1. Nuclear Materials and Their Analysis Needs
   • Nuclear Structural Materials & Characterization Needs
   • Nuclear Fuels & Characterization Needs
   • Nuclear Waste Forms & Characterization Needs
2. Introduction of Characterization Principles
   • Interactions of Probes with Matter and Criteria for Technique Selection
   • Methods of Characterization
3. Atomic Structure and Spectra
   • Quantum Numbers, Spin–Orbit Coupling, Transitions of Electrons
   • Characteristic X-Ray Emissions, X-Ray Absorption and Filtering
   • Wavelength Dispersion Spectrometer & Energy Dispersive X-Ray Spectrometer
   • Chemical X-Ray Microanalysis
   • Electron Probe Microanalysis & Quantitative X-Ray Microanalysis
4. X-ray Scattering and Diffraction
   • Reciprocal Space & Reciprocal Lattice
   • Methods of X-Ray Diffraction
   • Interaction of X-Rays with Electrons
   • Scattering by an Atom & Atomic Scattering Factor
   • Scattering by a Crystal & Structure Factor
   • Crystal Symmetry, Friedel Law
   • Phase Identification, Structure Refinement & Rietveld Method
   • Applications of X-Ray Diffraction
5. Electron Diffraction
   • The Atomic Scattering Factor for Electrons
   • Coherent, Incoherent, Elastic, and Inelastic Scattering
   • Kinematical Theory of Electron Diffraction
   • Selected Area Diffraction & Nanobeam Diffraction
   • Kikuchi Lines
   • Convergent Beam Electron Diffraction
6. TEM Imaging
   • Bright-Field & Dark-Field Imaging
   • On-Zone STEM
   • HRTEM Imaging
   • HRSTEM Imaging & z-contrast
   • In Situ TEM
7. SEM Imaging
   • Secondary Electrons & Back-Scattered Electrons
   • Electron Back-Scattered Diffraction (EBSD)
   • Small Scale Mechanical Testing
8. Special Lectures
   • Hot Cell, Sampling, Sub-sampling, and Focused Ion Beam
   • Post-irradiation Examination
   • Neutron Diffraction and Imaging
   • Positron Annihilation Spectroscopy
   • Surface Analysis Techniques
   • Electron Energy Loss Spectroscopy
   • Atom Probe Tomography
   • Synchrotron Radiation

Textbooks

K.M. Krishnan, Principles of Materials Characterization and Metrology, Oxford University Press, Oxford, UK, 2021

David B. Williams, C. Barry Carter, Transmission Electron Microscopy – A Textbook for Materials Science, Springer, 2009.

Created:11/20/2023